Microstructure observation using scanning electron microscopy

determination of surface morphology of solids by SEM technique (including shape observations and analysis of the size of inclusions, analysis of defects, cracks, etc.),
analysis of the chemical composition of solid in micro-areas using X-ray spectroscopy with energy dispersion: qualitative and quantitative analysis of chemical composition in micro-areas, distribution of elements along the electron beam line (linescan) and from the surface (mapping) using EDS spectrometer,
analysis of topographic orientation and phase identification of crystalline materials using the backscattered electron diffraction (EBSD) technique
point, line and surface analysis of elements using wavelength-dispersive X-ray spectroscopy (WDS).

Contact:

Ph.D Małgorzata Perek-Nowak
tel: 12 617 45 99
e-mail: mperek@agh.edu.pl

Ph.D Paweł Pałka
tel: 12 617 50 74
e-mail: pawel.palka@agh.edu.pl

Ph.D. Piotr Noga
tel. 12 617 26 45
e-mail: pionoga@agh.edu.pl